The two Spectro products are inductively coupled plasma optical emission spectrometry (ICP-OES) and energy dispersive X-ray fluorescence (XRF) technologies have seen dramatic improvements in recent years. Spectro flagship instruments showcase the advances that this field has seen with the Spectro Arcos ICP-OES analyzer and the Spectro XEPOS ED-XRF analyzer.
Spectro Arcos high-resolution ICP-OES analyzer represents the pinnacle of productivity and performance as the first and only spectrometer featuring the fast, convenient selection of axial plasma or radial plasma observation in a single instrument — without any optical compromise. The analyzer delivers dramatically improved sensitivity, stability, and precision — at lower operating costs.
Spectro Xepos ED-XRF spectrometer represents a quantum leap in ED-XRF technology, providing breakthrough advances in the multi-elemental analysis of major, minor, and trace element concentrations. New developments in detection deliver quality sensitivity and detection limits and gains in precision and accuracy.