Rigaku updates MiniFlex X-ray diffractometer

Rigaku MiniFlex benchtop X-ray diffractometer

The latest iteration of Rigaku Corp.’s long-running MiniFlex benchtop X-ray diffractometer (XRD) is a multi purpose analytical instrument that can determine: phase identification and quantification, crystallinity percentage, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure.

This six-generation instrument is ideal for use in research, especially in material science and chemistry, as well as in industry for research and quality control.

Rigaku introduced the original Miniflex XRD diffraction instrument back it 1973. The device was about one-tenth the size, and dramatically less expensive, than conventional X-ray diffraction (XRD) equipment of the period.

The Gen 6 addition to the family delivers speed and sensitivity through innovative technological advances, including the HyPix-400 MF 2D hybrid pixel array detector (HPAD) together with an available 600 W X-ray sources and new 8-position automatic sample changer.

Direct photon counting detector enables high-speed, low-noise data collection and may be operated in 0D and 1D modes for conventional XRD analysis and 2D mode for samples with coarse grain size and/or preferred orientation.

A variety of X-ray tube anodes – along with a range of sample rotation and positioning accessories, together with a variety of temperature attachments – are offered to ensure that the MiniFlex X-ray diffraction (XRD) system is versatile enough to perform challenging qualitative and quantitative analyses of a broad range of samples, whether performing research or routine quality control.

The unit comes with the latest version of PDXL, Rigaku’s full-function powder diffraction analysis package. PDXL is one-stop full-function powder diffraction analysis software suite. The software comes with a modular design, advanced engine, and user-friendly graphic user interface.

PDXL offers important new functionality; including a fundamental parameter method (FP) for more accurate peak calculation, phase identification using the Crystallography Open Database (COD), and a wizard for ab inito crystal structure analysis.

PDXL provides various analysis tools such as automatic phase identification, quantitative analysis, crystallite-size analysis, lattice constants refinement, Rietveld analysis, ab initio structure determination, and more.

The PDXL clustering feature can group multiple scan data based on the similarity of powder diffraction patterns and peak positions and displays the grouped data in an easy-to-read tree. This is particularly effective when it comes to classifying and screening the data from a large number of scans.

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