Horiba Scientific’s offers reference ellipsometer for thin film measurements

The Horiba Scientific Univel Plus modular ellipsometer

Horiba Scientific, a maker of has launched Uvisel Plus, a modular ellipsometer which is designed to measure thin film samples faster, and more accurately than previous models.

The Uvisel Plus incorporates Horiba’s FastAcq technology. FastAcq is based on a new electronic data processing and high-speed monochromator which enables it to take sample measurements from 190 to 2100nm to be completed within 3 minutes, at high resolution. The ability to continuously adjust the spectral resolution along the measurement range enables to scan a sample smarter and faster.

Uvisel Plus also introduces a new calibration procedure, delivering faster performance and accuracy. The new ellipsometer has no rotating elements and no additional components in the optical path.

Designed for enhanced flexibility for thin film measurements, the Uvisel Plus offers microspots for patterned samples down to 50µm, a variable angle from 40 to 90°, an automatic horizontal mapping stage and a variety of accessories, making it scalable to meet all of your application and budget needs.

The spectral range from 190 to 2100 nm is covered by only two UVISEL Plus configurations: 190-920 nm and an NIR extension up to 2100 nm.

The Uvisel Plus is also easy to upgrade to meet future demands.

With the DeltaPsi2 software platform, as well as the Auto-Soft interface featuring an intuitive workflow to speed up data collection and analysis, the Uvisel Plus allows users from novice to expert to perform thin film measurements with the highest accuracy and sensitivity.

The Uvisel Plus comes with on-site installation and training, technical support, and application support to help optimize your thin film modeling.  For more information, click here.


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